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The influence of residue on space charge accumulation in purposely modified thick plaque XLPE sample for DC application

Fu, M., Chen, G. and Fothergill, J. (2005). The influence of residue on space charge accumulation in purposely modified thick plaque XLPE sample for DC application. Paper presented at the 14th International Symposium on High Voltage Engineering, 25 - 29 August 2005, Tsinghua University, Beijing.

Abstract

Effects of cross-linking by-products (residues) of polyethylene on space charge accumulation and decay are investigated in the paper using the pulsed electro-acoustic technique. Space charge profiles have shown a great variation both in the charge initiation over the voltage ramping up process and later on long term stressing and decay (volts off) among the samples subjected to different conditioning, which results in diverse residues content (fresh, 0.5% residue and thoroughly degassed). The results show that by-products of cross-linking or the residual impurities play a key role in the space charge accumulation in cross-linked polyethylene. On the removal of impurities by degassing, small homocharge was built up in the vicinity of the electrode. It is concluded that space charge accumulation is governed by the charge injection through dielectric/electrode interface when sample is thoroughly degassed.

Publication Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Departments: Presidents's Portfolio
School of Mathematics, Computer Science & Engineering > Engineering > Electrical & Electronic Engineering
URI: http://openaccess.city.ac.uk/id/eprint/1396
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