Multifunction interferometry using the electron mobility visibility and mean free path relationship

Pornsuwancharoen, N., Youplao, P., Amiri, I. S., Aziz, M. S., Tran, Q. L., Ali, J., Yupapin, P. & Grattan, K. T. V. (2018). Multifunction interferometry using the electron mobility visibility and mean free path relationship. Microscopy Research and Technique, doi: 10.1002/jemt.23049

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Abstract

A conventional Michelson interferometer is modified and used to form the various types of interferometers. The basic system consists of a conventional Michelson interferometer with silicon-graphene-gold embedded between layers on the ports. When light from the monochromatic source is input into the system via the input port (silicon waveguide), the change in optical path difference (OPD) of light traveling in the stacked layers introduces the change in the optical phase, which affects to the electron mean free path within the gold layer, induces the change in the overall electron mobility can be seen by the interferometer output visibility. Further plasmonic waves are introduced on the graphene thin film and the electron mobility occurred within the gold layer, in which the light-electron energy conversion in terms of the electron mobility can be observed, the gold layer length is 100 nm. The measurement resolution in terms of the OPD of ∼50 nm is achieved. In applications, the outputs of the drop port device of the modified Michelson interferometer can be arranged by the different detectors, where the polarized light outputs, the photon outputs, the electron spin outputs can be obtained by the interference fringe visibility, mobility visibility and the spin up-down splitting output energies. The modified Michelson interferometer theory and the detection schemes are given in details.

Publication Type: Article
Additional Information: This is the pre-peer reviewed version of the following article: Pornsuwancharoen, N., Youplao, P., Amiri, I. S., Aziz, M. S., Tran, Q. L., Ali, J., Yupapin, P. & Grattan, K. T. V. (2018). Multifunction interferometry using the electron mobility visibility and mean free path relationship. Microscopy Research and Technique, which has been published in final form at https://doi.org/10.1002/jemt.23049. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions.
Publisher Keywords: Multifunction interferometry; Electro optic sensors; Interferometric sensors, Electron mobility
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Departments: School of Mathematics, Computer Science & Engineering > Engineering > Electrical & Electronic Engineering
URI: http://openaccess.city.ac.uk/id/eprint/20029

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