Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction

Bishop, P. G. & Bloomfield, R. E. (2003). Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction. Paper presented at the 14th IEEE International Symposium on Software Reliability Engineering (ISSRE 2003), 17 - 20 Nov 2003, Denver, Colorado.

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Abstract

Prior research has suggested that the failure rates of faults follow a log normal distribution. We propose a specific model where distributions close to a log normal arise naturally from the program structure. The log normal distribution presents a problem when used in reliability growth models as it is not mathematically tractable. However we demonstrate that a worst case bound can be estimated that is less pessimistic than our earlier worst case bound theory.

Item Type: Conference or Workshop Item (Paper)
Additional Information: © 2003 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
Subjects: Q Science > QA Mathematics > QA76 Computer software
Divisions: School of Informatics > Centre for Software Reliability
URI: http://openaccess.city.ac.uk/id/eprint/544

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