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Items where Author is "Nilsson, U. H."

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Number of items: 5.

Article

Fothergill, J., Dodd, S. J., Dissado, L. A., Liu, T. and Nilsson, U. H. (2011). The measurement of very low conductivity and dielectric loss in XLPE cables: A possible method to detect degradation due to thermal aging. IEEE Transactions on Dielectrics and Electrical Insulation, 18(5), pp. 1544-1553. doi: 10.1109/TDEI.2011.6032823

Liu, T., Fothergill, J., Dodd, S. J., Dissado, L. A., Nilsson, U. H., Fu, M. and Perrot, F. (2010). Dielectric spectroscopy study of thermally-aged extruded model power cables. 2010 10th IEEE International Conference on Solid Dielectrics (ICSD), pp. 1-4. doi: 10.1109/ICSD.2010.5568077

Dissado, L. A., Fothergill, J., Seeley, A., Stevens, G. C., Markey, L., Laurent, C., Teyssedre, G., Nilsson, U. H., Platbrood, G. and Montanari, G. C. (2000). Characterizing HV XLPE cables by electrical, chemical and microstructural measurements on cable peeling: Effects of surface roughness, thermal treatment and peeling location. Electrical Insulation and Dielectric Phenomena, 2000, Annual Report, 1, pp. 136-140. doi: 10.1109/CEIDP.2000.885246

Conference or Workshop Item

Tong, L., Fothergill, J., Dodd, S. J., Dissado, L. A., Nilsson, U. H. and Mingli, F. (2010). Dielectric spectroscopy study of thermally-aged extruded model power cables. Paper presented at the 10th IEEE International Conference on Solid Dielectrics, 04 - 09 July 2010, Postdam, Germany.

Liu, T., Fothergill, J., Dodd, S. J. and Nilsson, U. H. (2009). Influence of semicon shields on the dielectric loss of XLPE cables. CEIDP: 2009 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, pp. 395-398. ISSN 0084-9162

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