Studies on Temperature and Strain Sensitivities of a Few-mode Critical Wavelength Fiber Optic Sensor
Lu, C., Su, J., Dong, X. , Lu, L., Sun, T. ORCID: 0000-0003-3861-8933 & Grattan, K. T. V. ORCID: 0000-0003-2250-3832 (2018). Studies on Temperature and Strain Sensitivities of a Few-mode Critical Wavelength Fiber Optic Sensor. IEEE Sensors Journal, 19(5), pp. 1794-1801. doi: 10.1109/jsen.2018.2883321
Abstract
This paper studied the relationship between the temperature/strain wavelength sensitivity of a fiber optic in-line Mach-Zehnder Interferometer (MZI) sensor and the wavelength separation of the measured wavelength to the critical wavelength (CWL) in a CWL-existed interference spectrum formed by interference between LP01 and LP02 modes. The in-line MZI fiber optic sensor has been constructed by splicing a section of specially designed few-mode fiber (FMF), which support LP01 and LP02 modes propagating in the fiber, between two pieces of single mode fiber. The propagation constant difference, Δβ, between the LP01 and LP02 modes, changes non-monotonously with wavelength and reaches a maximum at the CWL. As a result, in sensor operation, peaks on the different sides of the CWL then shift in opposite directions, and the associated temperature/strain sensitivities increase significantly when the measured wavelength points become close to the CWL, from both sides of the CWL. A theoretical analysis carried out has predicted that with this specified FMF sensor approach, the temperature/strain wavelength sensitivities are governed by the wavelength difference between the measured wavelength and the CWL. This conclusion was seen to agree well with the experimental results obtained. Combining the wavelength shifts of the peaks and the CWL in the transmission spectrum of the SFS structure, this study has shown that this approach forms the basis of effective designs of high sensitivity sensors for multi-parameter detection and offering a large measurement range to satisfy the requirements needed for better industrial measurements.
Publication Type: | Article |
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Additional Information: | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
Publisher Keywords: | In-line Mach-Zehnder interferometer, few mode fiber, critical wavelength, strain sensitivity, temperature sensitivity |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
Departments: | School of Science & Technology > Engineering |
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