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Modelling road hazards and the effect on AV safety of hazardous failures

Popov, P. T. ORCID: 0000-0002-3434-5272, Buerkle, C., Oboril, F. , Paulitsch, M. & Strigini, L. ORCID: 0000-0002-4246-2866 (2022). Modelling road hazards and the effect on AV safety of hazardous failures. In: 2022 IEEE 25th International Conference on Intelligent Transportation Systems (ITSC). The 25th IEEE International Conference on Intelligent Transportation Systems (IEEE ITSC 2022), 8 Oct - 12 Oct 2022, Macau, China. doi: 10.1109/ITSC55140.2022.9922283


Autonomous vehicles (AV) are about to appear on our roads within the next few years. However, to achieve the final breakthrough, not only functional progress is required, but also fundamental safety questions must be solved. Among those, a question demanding special attention is the need to assess the overall safety of an AV and quantify that it is safe enough to take part in normal traffic despite its inherent imperfections. Therefore, this paper describes a probabilistic model, which allows to study how imperfections of an AV perception system and of mechanisms responsible for AV safety (e.g., Safety Monitors), can impact AV safety in the presence of road hazards. We also demonstrate how the model can be used to validate if the AV is safe enough, to understand the criticality of (perception) errors, and to identify areas/parameters that have more influence on safety than others.

Publication Type: Conference or Workshop Item (Paper)
Additional Information: © 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Subjects: H Social Sciences > HE Transportation and Communications
Q Science > QA Mathematics > QA75 Electronic computers. Computer science
Departments: School of Science & Technology > Computer Science > Software Reliability
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