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Items where Author is "Gelman, L."

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Chen, X., Shaw, C., Gelman, L. and Grattan, K. T. V. ORCID: 0000-0003-2250-3832 (2019). Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques. Measurement, 139, pp. 387-402. doi: 10.1016/j.measurement.2019.03.026

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