Items where Author is "Gopalakrishnan, S."
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Conference or Workshop Item
Salako, K. 
ORCID: 0000-0003-0394-7833, Gashi, I. ORCID: 0000-0002-8017-3184, Pattabiraman, K. , Gopalakrishnan, S. & Chan, A. (2026).
The Statistical Assessment of Bayes-"sub"optimal Binary Machine Learning Classifier Risk.
In:
Computer Safety, Reliability, and Security.
The 45th International Conference on Computer Safety, Reliability and Security (SafeComp 2026), 22-25 Sep 2026, Valencia, Spain.
doi: 10.1007/978-3-032-34867-8_19