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Items where Author is "Nilsson, U. H."

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Number of items: 5.

Article

Fothergill, J., Dodd, S. J., Dissado, L. A. , Liu, T. & Nilsson, U. H. (2011). The measurement of very low conductivity and dielectric loss in XLPE cables: A possible method to detect degradation due to thermal aging. IEEE Transactions on Dielectrics and Electrical Insulation, 18(5), pp. 1544-1553. doi: 10.1109/TDEI.2011.6032823

Liu, T., Fothergill, J., Dodd, S. J. , Dissado, L. A., Nilsson, U. H., Fu, M. & Perrot, F. (2010). Dielectric spectroscopy study of thermally-aged extruded model power cables. 2010 10th IEEE International Conference on Solid Dielectrics (ICSD), pp. 1-4. doi: 10.1109/ICSD.2010.5568077

Dissado, L. A., Fothergill, J., Seeley, A. , Stevens, G. C., Markey, L., Laurent, C., Teyssedre, G., Nilsson, U. H., Platbrood, G. & Montanari, G. C. (2000). Characterizing HV XLPE cables by electrical, chemical and microstructural measurements on cable peeling: Effects of surface roughness, thermal treatment and peeling location. Electrical Insulation and Dielectric Phenomena, 2000, Annual Report, 1, pp. 136-140. doi: 10.1109/CEIDP.2000.885246

Conference or Workshop Item

Tong, L., Fothergill, J., Dodd, S. J. , Dissado, L. A., Nilsson, U. H. & Mingli, F. (2010). Dielectric spectroscopy study of thermally-aged extruded model power cables. Paper presented at the 10th IEEE International Conference on Solid Dielectrics, 04 - 09 July 2010, Postdam, Germany. doi: 10.1109/ICSD.2010.5568077

Liu, T., Fothergill, J., Dodd, S. J. & Nilsson, U. H. (2009). Influence of semicon shields on the dielectric loss of XLPE cables. CEIDP: 2009 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, pp. 395-398. ISSN 0084-9162

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