On-Demand MEMS Accelerometer Dynamic Response Acquisition and Output Dithering via Self Test Pin Actuation
Ioakim, P. & Triantis, I. F. 
ORCID: 0000-0002-8900-781X (2020).
On-Demand MEMS Accelerometer Dynamic Response Acquisition and Output Dithering via Self Test Pin Actuation.
In:
2020 IEEE SENSORS.
2020 IEEE SENSORS, 25-28 Oct 2020, Rotterdam, The Netherlands.
doi: 10.1109/sensors47125.2020.9278789
Abstract
Any sensor or system employed to measure a physical property will by default impart some alteration to the original signal due to its inherent non-perfect response. Knowing the relationship between the input and the output of such a sensor or system is therefore essential for the correct definition of the original signal measured. What is presented herein is an experimental investigation of determining a MEMS accelerometer's dynamic characteristics by repurposing the self test pin made available by the manufacturer for simple binary functionality test. The Analog Devices ADXL325 was used for all the experiments described in this document.
| Publication Type: | Conference or Workshop Item (Paper) |
|---|---|
| Additional Information: | © 2025 IEEE |
| Publisher Keywords: | MEMS accelerometer, self test pin, dynamic response |
| Subjects: | T Technology > TJ Mechanical engineering and machinery T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Departments: | School of Science & Technology School of Science & Technology > Engineering |
| SWORD Depositor: |
Available under License Creative Commons: Attribution International Public License 4.0.
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