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Kejalakshmy, N., Agrawal, A., Aden, Y. , Leung, D. M., Rahman, B. M. & Grattan, K. T. V. (2010). Characterization of silicon nanowire by use of full-vectorial finite element method.. Applied Optics, 49(16), pp. 3173-3181. doi: 10.1364/AO.49.003173