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SRML: Structure-relation mutual learning network for few-shot image classification

Li, X., Wang, L., Zhu, R. ORCID: 0000-0002-9944-0369 , Ma, Z., Cao, J. & Xue, J-H. (2025). SRML: Structure-relation mutual learning network for few-shot image classification. Pattern Recognition, 168, article number 111822. doi: 10.1016/j.patcog.2025.111822

Abstract

Few-shot image classification aims at tackling a challenging but practical classification setting, where only few labelled images are available for training. Metric-based methods are main-stream solutions for few-shot image classification, but many of them extract features that are either irrelevant to target objects in the query images or insufficient to describe the local shape or structural patterns within images, which can lead to mis-identification of the target objects, especially when the images are of multiple objects. To resolve this issue, we propose the structure-relation mutual learning (SRML) network, which first learns both the intra-image structural features and the inter-image relational features in a parallel fashion via two parallel branches, the structural feature extractor (SFE) and the relational feature extractor (RFE), and then harnesses mutual learning to enable knowledge exchange between them. In such a manner, the structural features learnt from the SFE branch not only contain the structural patterns within the images, but also focus more on the target objects, guided by the relational knowledge from the RFE branch. In return, the RFE branch can exploit the more-focused structural knowledge to better match the target objects in the support and query images. We conduct extensive experiments on four few-shot classification benchmark datasets to showcase the superior classification of the proposed SRML network, achieving a 3.17% improvement in classification accuracy over the leading competitor, RENet Kang et al. (2021). The code of this work can be found in https://github.com/Rilliant7/SRML.

Publication Type: Article
Additional Information: This is an open access article distributed under the terms of the Creative Commons CC-BY license, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Publisher Keywords: Few-shot image classification, Self-correlation, Cross-correlation, Mutual learning
Subjects: H Social Sciences > HA Statistics
Departments: Bayes Business School
Bayes Business School > Actuarial Science & Insurance
SWORD Depositor:
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